Characterization of electromagnetic properties of mid materials for high frequency applications up to 67 GHz
Abstract
This paper presents results of the research project: "Characterization of the radio frequency (RF) properties of LDS-MID" where RF parameters of laser direct structureable (LDS) molded interconnect device (MID) materials were investigated. First of all the most important material parameters influencing the RF performance of a device are introduced. In the next section the broadband characterization of the metallization and material properties using a coplanar waveguide (CPW) is described. For a selected LDS material the conduction losses due to different metallization compositions are discussed in detail.
Details
- Organisation(s)
-
Institute of Microwave and Wireless Systems
- Type
- Conference contribution
- Pages
- 63-68
- No. of pages
- 6
- Publication date
- 09.2014
- Publication status
- Published
- Peer reviewed
- Yes
- ASJC Scopus subject areas
- General Engineering
- Electronic version(s)
-
https://doi.org/10.4028/www.scientific.net/AMR.1038.63 (Access:
Closed
)
-
Details in the research portal "Research@Leibniz University"
Cite
Loading...
