Contactless scattering parameter measurements
Abstract
An introduction to contactless vector network analysis is given for the determination of the scattering parameters of embedded devices. In the measurement setup, contactless probes are connected to a conventional vector network analyzer. Suitable probes are developed for the implementation of a contactless measurement setup, whereas the positioning of the probes is essential for an accurate measurement setup. The contactlessly measured results are compared to results received with a conventional vector network analyzer. These comparisons show that it is possible to characterize embedded devices with the contactless vector network analysis at least up to 6 GHz using the suggested probes.
Details
- Organisationseinheit(en)
-
Institut für Hochfrequenztechnik und Funksysteme
- Externe Organisation(en)
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Panasonic Industrial Devices Europe GmbH
- Typ
- Artikel
- Journal
- IEEE Microwave and Wireless Components Letters
- Band
- 21
- Seiten
- 504-506
- Anzahl der Seiten
- 3
- ISSN
- 1531-1309
- Publikationsdatum
- 09.2011
- Publikationsstatus
- Veröffentlicht
- Peer-reviewed
- Ja
- ASJC Scopus Sachgebiete
- Physik der kondensierten Materie, Elektrotechnik und Elektronik
- Elektronische Version(en)
-
https://doi.org/10.1109/LMWC.2011.2162619 (Zugang:
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)
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