Contactless vector network analysis
A new approach for S-parameter measurements
Abstract
After a short introduction to conventional vector network analysis the principle and the implementation of a contactless measurement setup for the determination of the scattering parameters of embedded devices is presented. Suitable contactless and pseudo-contactless probes are developed for the implementation of the setup and calibration procedures which take the characteristic of the probes into account are described. For verification purposes the contactlessly measured results are compared with results received with a conventional vector network analyzer as well as with simulation results obtained with a 3D field simulator.
Details
- Organisationseinheit(en)
-
Institut für Hochfrequenztechnik und Funksysteme
- Externe Organisation(en)
-
Rosenberger Hochfrequenztechnik GmbH und Co. KG
- Typ
- Aufsatz in Konferenzband
- Seiten
- 1266-1289
- Anzahl der Seiten
- 24
- Publikationsdatum
- 2009
- Publikationsstatus
- Veröffentlicht
- Peer-reviewed
- Ja
- ASJC Scopus Sachgebiete
- Computernetzwerke und -kommunikation, Elektrotechnik und Elektronik
Zitieren
Laden...
